TY  - JOUR
TI  - Smart attendance monitoring system using multimodal biometrics
AU  - J, S.
AU  - GUDAVALLI, M.
JO  - Sigma Journal of Engineering and Natural Sciences
PY  - 2025
VL  - 43
SP  - 168
EP  - 188
DO  - 10.14744/sigma.2024.00030
ER  -